【secondary_ion_mass_spectrometry】什么意思_英语secondary_ion_mass_spectrometry的翻译_音标_读音_用法_例句_在线翻译

abstract: Secondary ion mass spectrometry (SIMS) is a technique used in materials science and surface science to analyze the composition of solid surfaces and thin films by sputtering the surface of the specimen with a focused primary ion beam and collecting and analyzing ejected secondary ions. The mass/charge ratios of these secondary ions are measured with a mass spectrometer to determine the elemental, isotopic, or molecular composition of the surface to a depth of 1 to 2 nm.

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Secondary ion mass spectrometry was used to measure the distribution of implanted depths of boron ions.

用二次离子质谱测量了注入硼离子的深度分布。

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Additionally, chemical composition and thickness of oxide layers, occurring in both studied cases, were analyzed by secondary ion mass spectrometry.

此外，两种不同表面状态下的化学成分以及氧化层都通过二次离子质谱测定法进行了分析。

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Time-of-Flight secondary ion mass spectrometry (TOF-SIMS) is a very sensitive surface analytical technique, well established for many industrial and research applications.

飞行时间二次离子质谱（TOF- SIMS）是一种非常灵敏的表面检测技术。

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更多双语例句

Using a technique called secondary ion mass spectrometry, the team determined that the mantle from which the meteorites derived contained between 70 and 300 parts per million (ppm) of water.

MSN: Scientists say parts of Mars interior are as wet as Earth's

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secondary ion mass spectrometry